Cloninger, Alexander, Mishne, Gal, Oslandsbotn, Andreas, Robertson, Sawyer J, Wan, Zhengchao, and Wang, Yusu. Random Walks, Conductance, and Resistance for the Connection Graph Laplacian. Retrieved from https://par.nsf.gov/biblio/10547511. SIAM Journal on Matrix Analysis and Applications 45.3 Web. doi:10.1137/23M1595400.

Cloninger, Alexander, Mishne, Gal, Oslandsbotn, Andreas, Robertson, Sawyer J, Wan, Zhengchao, & Wang, Yusu. Random Walks, Conductance, and Resistance for the Connection Graph Laplacian. SIAM Journal on Matrix Analysis and Applications, 45 (3). Retrieved from https://par.nsf.gov/biblio/10547511. https://doi.org/10.1137/23M1595400

Cloninger, Alexander, Mishne, Gal, Oslandsbotn, Andreas, Robertson, Sawyer J, Wan, Zhengchao, and Wang, Yusu. "Random Walks, Conductance, and Resistance for the Connection Graph Laplacian". SIAM Journal on Matrix Analysis and Applications 45 (3). Country unknown/Code not available: SIAM Journal of Matrix Analysis and Applications. https://doi.org/10.1137/23M1595400. https://par.nsf.gov/biblio/10547511.

@article{osti_10547511,
place = {Country unknown/Code not available}, title = {Random Walks, Conductance, and Resistance for the Connection Graph Laplacian}, url = {https://par.nsf.gov/biblio/10547511}, DOI = {10.1137/23M1595400}, abstractNote = {}, journal = {SIAM Journal on Matrix Analysis and Applications}, volume = {45}, number = {3}, publisher = {SIAM Journal of Matrix Analysis and Applications}, author = {Cloninger, Alexander and Mishne, Gal and Oslandsbotn, Andreas and Robertson, Sawyer J and Wan, Zhengchao and Wang, Yusu}, }