Wang, Xiaopeng, Nomoto, Kazuki, Fabi, Gianluca, Farina, Marco, Jena, Debdeep, Xing, Huili Grace, and Hwang, James_C M. Quantitative Scanning Microwave Microscopy for Transfer Characteristics of GaN High-Electron-Mobility Transistors. Retrieved from https://par.nsf.gov/biblio/10548193. IEEE Transactions on Microwave Theory and Techniques . Web. doi:10.1109/tmtt.2024.3449128.

Wang, Xiaopeng, Nomoto, Kazuki, Fabi, Gianluca, Farina, Marco, Jena, Debdeep, Xing, Huili Grace, & Hwang, James_C M. Quantitative Scanning Microwave Microscopy for Transfer Characteristics of GaN High-Electron-Mobility Transistors. IEEE Transactions on Microwave Theory and Techniques, (). Retrieved from https://par.nsf.gov/biblio/10548193. https://doi.org/10.1109/tmtt.2024.3449128

Wang, Xiaopeng, Nomoto, Kazuki, Fabi, Gianluca, Farina, Marco, Jena, Debdeep, Xing, Huili Grace, and Hwang, James_C M. "Quantitative Scanning Microwave Microscopy for Transfer Characteristics of GaN High-Electron-Mobility Transistors". IEEE Transactions on Microwave Theory and Techniques (). Country unknown/Code not available: IEEE. https://doi.org/10.1109/tmtt.2024.3449128. https://par.nsf.gov/biblio/10548193.

@article{osti_10548193,
place = {Country unknown/Code not available}, title = {Quantitative Scanning Microwave Microscopy for Transfer Characteristics of GaN High-Electron-Mobility Transistors}, url = {https://par.nsf.gov/biblio/10548193}, DOI = {10.1109/tmtt.2024.3449128}, abstractNote = {}, journal = {IEEE Transactions on Microwave Theory and Techniques}, publisher = {IEEE}, author = {Wang, Xiaopeng and Nomoto, Kazuki and Fabi, Gianluca and Farina, Marco and Jena, Debdeep and Xing, Huili Grace and Hwang, James_C M}, }