Hart, James L, Siddique, Saif, Schnitzer, Noah, Funni, Stephen, Kourkoutis, Lena F, and Cha, Judy J. In Situ Cryogenic Cooling, Electric Biasing, and 4D-STEM of the 1T-TaS2 Charge Density Wave Transition. Retrieved from https://par.nsf.gov/biblio/10548658. Microscopy and Microanalysis 30.Supplement_1 Web. doi:10.1093/mam/ozae044.673.

Hart, James L, Siddique, Saif, Schnitzer, Noah, Funni, Stephen, Kourkoutis, Lena F, & Cha, Judy J. In Situ Cryogenic Cooling, Electric Biasing, and 4D-STEM of the 1T-TaS2 Charge Density Wave Transition. Microscopy and Microanalysis, 30 (Supplement_1). Retrieved from https://par.nsf.gov/biblio/10548658. https://doi.org/10.1093/mam/ozae044.673

Hart, James L, Siddique, Saif, Schnitzer, Noah, Funni, Stephen, Kourkoutis, Lena F, and Cha, Judy J. "In Situ Cryogenic Cooling, Electric Biasing, and 4D-STEM of the 1T-TaS2 Charge Density Wave Transition". Microscopy and Microanalysis 30 (Supplement_1). Country unknown/Code not available: Oxford Academic. https://doi.org/10.1093/mam/ozae044.673. https://par.nsf.gov/biblio/10548658.

@article{osti_10548658,
place = {Country unknown/Code not available}, title = {In Situ Cryogenic Cooling, Electric Biasing, and 4D-STEM of the 1T-TaS2 Charge Density Wave Transition}, url = {https://par.nsf.gov/biblio/10548658}, DOI = {10.1093/mam/ozae044.673}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {30}, number = {Supplement_1}, publisher = {Oxford Academic}, author = {Hart, James L and Siddique, Saif and Schnitzer, Noah and Funni, Stephen and Kourkoutis, Lena F and Cha, Judy J}, }