Title: Improving Robustness of Electron Ptychography by Bayesian Optimization of Tilt and Thickness
Award ID(s):
1719875
PAR ID:
10548793
Author(s) / Creator(s):
;
Publisher / Repository:
Oxford Academic
Date Published:
Journal Name:
Microscopy and Microanalysis
Volume:
30
Issue:
Supplement_1
ISSN:
1431-9276
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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