Panda, Sambit, Shen, Cencheng, Perry, Ronan, Zorn, Jelle, Lutz, Antoine, Priebe, Carey E, and Vogelstein, Joshua T. Universally consistent K-sample tests via dependence measures. Retrieved from https://par.nsf.gov/biblio/10549039. Statistics & Probability Letters 216.C Web. doi:10.1016/j.spl.2024.110278.

Panda, Sambit, Shen, Cencheng, Perry, Ronan, Zorn, Jelle, Lutz, Antoine, Priebe, Carey E, & Vogelstein, Joshua T. Universally consistent K-sample tests via dependence measures. Statistics & Probability Letters, 216 (C). Retrieved from https://par.nsf.gov/biblio/10549039. https://doi.org/10.1016/j.spl.2024.110278

Panda, Sambit, Shen, Cencheng, Perry, Ronan, Zorn, Jelle, Lutz, Antoine, Priebe, Carey E, and Vogelstein, Joshua T. "Universally consistent K-sample tests via dependence measures". Statistics & Probability Letters 216 (C). Country unknown/Code not available: elsevier. https://doi.org/10.1016/j.spl.2024.110278. https://par.nsf.gov/biblio/10549039.

@article{osti_10549039,
place = {Country unknown/Code not available}, title = {Universally consistent K-sample tests via dependence measures}, url = {https://par.nsf.gov/biblio/10549039}, DOI = {10.1016/j.spl.2024.110278}, abstractNote = {}, journal = {Statistics & Probability Letters}, volume = {216}, number = {C}, publisher = {elsevier}, author = {Panda, Sambit and Shen, Cencheng and Perry, Ronan and Zorn, Jelle and Lutz, Antoine and Priebe, Carey E and Vogelstein, Joshua T}, }