Bhatt, Lopa, Hart, James L, Bianco, Elisabeth, Cha, Judy, and Kourkoutis, Lena F. Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging. Retrieved from https://par.nsf.gov/biblio/10549393. Microscopy and Microanalysis 29.Supplement_1 Web. doi:10.1093/micmic/ozad067.897.

Bhatt, Lopa, Hart, James L, Bianco, Elisabeth, Cha, Judy, & Kourkoutis, Lena F. Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging. Microscopy and Microanalysis, 29 (Supplement_1). Retrieved from https://par.nsf.gov/biblio/10549393. https://doi.org/10.1093/micmic/ozad067.897

Bhatt, Lopa, Hart, James L, Bianco, Elisabeth, Cha, Judy, and Kourkoutis, Lena F. "Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging". Microscopy and Microanalysis 29 (Supplement_1). Country unknown/Code not available: Oxford Academic. https://doi.org/10.1093/micmic/ozad067.897. https://par.nsf.gov/biblio/10549393.

@article{osti_10549393,
place = {Country unknown/Code not available}, title = {Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging}, url = {https://par.nsf.gov/biblio/10549393}, DOI = {10.1093/micmic/ozad067.897}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {29}, number = {Supplement_1}, publisher = {Oxford Academic}, author = {Bhatt, Lopa and Hart, James L and Bianco, Elisabeth and Cha, Judy and Kourkoutis, Lena F}, }