Houser, Elizabeth, Mc_Knight, Thomas V, Redwing, Joan M, and Peiris, Frank C. Modeling the coverage of MoS2 and WS2 thin films using in-situ spectroscopic ellipsometry. Retrieved from https://par.nsf.gov/biblio/10552681. Journal of Crystal Growth 640.C Web. doi:10.1016/j.jcrysgro.2024.127741.

Houser, Elizabeth, Mc_Knight, Thomas V, Redwing, Joan M, & Peiris, Frank C. Modeling the coverage of MoS2 and WS2 thin films using in-situ spectroscopic ellipsometry. Journal of Crystal Growth, 640 (C). Retrieved from https://par.nsf.gov/biblio/10552681. https://doi.org/10.1016/j.jcrysgro.2024.127741

Houser, Elizabeth, Mc_Knight, Thomas V, Redwing, Joan M, and Peiris, Frank C. "Modeling the coverage of MoS2 and WS2 thin films using in-situ spectroscopic ellipsometry". Journal of Crystal Growth 640 (C). Country unknown/Code not available: Journal of Crystal Growth. https://doi.org/10.1016/j.jcrysgro.2024.127741. https://par.nsf.gov/biblio/10552681.

@article{osti_10552681,
place = {Country unknown/Code not available}, title = {Modeling the coverage of MoS2 and WS2 thin films using in-situ spectroscopic ellipsometry}, url = {https://par.nsf.gov/biblio/10552681}, DOI = {10.1016/j.jcrysgro.2024.127741}, abstractNote = {}, journal = {Journal of Crystal Growth}, volume = {640}, number = {C}, publisher = {Journal of Crystal Growth}, author = {Houser, Elizabeth and Mc_Knight, Thomas V and Redwing, Joan M and Peiris, Frank C}, }