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Title: AFM Imaging Defect Detection and Classification Using Deep Learning
Award ID(s):
1751503 2409359
PAR ID:
10556113
Author(s) / Creator(s):
; ;
Publisher / Repository:
IEEE
Date Published:
Journal Name:
IEEE Access
Volume:
12
ISSN:
2169-3536
Page Range / eLocation ID:
132027 to 132037
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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