D'Mello, Sidney K, Moulder, Robert G, and Jensen, Emily. Momentary measures of emotions during technology-enhanced learning prospectively predict standardized test scores in two large samples. Retrieved from https://par.nsf.gov/biblio/10556467. Learning and Instruction 90.C Web. doi:10.1016/j.learninstruc.2023.101872.

D'Mello, Sidney K, Moulder, Robert G, & Jensen, Emily. Momentary measures of emotions during technology-enhanced learning prospectively predict standardized test scores in two large samples. Learning and Instruction, 90 (C). Retrieved from https://par.nsf.gov/biblio/10556467. https://doi.org/10.1016/j.learninstruc.2023.101872

D'Mello, Sidney K, Moulder, Robert G, and Jensen, Emily. "Momentary measures of emotions during technology-enhanced learning prospectively predict standardized test scores in two large samples". Learning and Instruction 90 (C). Country unknown/Code not available: Science Direct. https://doi.org/10.1016/j.learninstruc.2023.101872. https://par.nsf.gov/biblio/10556467.

@article{osti_10556467,
place = {Country unknown/Code not available}, title = {Momentary measures of emotions during technology-enhanced learning prospectively predict standardized test scores in two large samples}, url = {https://par.nsf.gov/biblio/10556467}, DOI = {10.1016/j.learninstruc.2023.101872}, abstractNote = {}, journal = {Learning and Instruction}, volume = {90}, number = {C}, publisher = {Science Direct}, author = {D'Mello, Sidney K and Moulder, Robert G and Jensen, Emily}, }