Wang, Tianzhao, Liu, Xun, Schneiderman, Benjamin, Clark, Samuel J, Chuang, Andrew Chihpin, and Yu, Zhenzhen. In situ synchrotron X-ray diffraction analysis of ultrasonically assisted microstructure refinement during laser melting process. Retrieved from https://par.nsf.gov/biblio/10559649. Scripta Materialia 242.C Web. doi:10.1016/j.scriptamat.2023.115946.

Wang, Tianzhao, Liu, Xun, Schneiderman, Benjamin, Clark, Samuel J, Chuang, Andrew Chihpin, & Yu, Zhenzhen. In situ synchrotron X-ray diffraction analysis of ultrasonically assisted microstructure refinement during laser melting process. Scripta Materialia, 242 (C). Retrieved from https://par.nsf.gov/biblio/10559649. https://doi.org/10.1016/j.scriptamat.2023.115946

Wang, Tianzhao, Liu, Xun, Schneiderman, Benjamin, Clark, Samuel J, Chuang, Andrew Chihpin, and Yu, Zhenzhen. "In situ synchrotron X-ray diffraction analysis of ultrasonically assisted microstructure refinement during laser melting process". Scripta Materialia 242 (C). Country unknown/Code not available: Elsevier Ltd.. https://doi.org/10.1016/j.scriptamat.2023.115946. https://par.nsf.gov/biblio/10559649.

@article{osti_10559649,
place = {Country unknown/Code not available}, title = {In situ synchrotron X-ray diffraction analysis of ultrasonically assisted microstructure refinement during laser melting process}, url = {https://par.nsf.gov/biblio/10559649}, DOI = {10.1016/j.scriptamat.2023.115946}, abstractNote = {}, journal = {Scripta Materialia}, volume = {242}, number = {C}, publisher = {Elsevier Ltd.}, author = {Wang, Tianzhao and Liu, Xun and Schneiderman, Benjamin and Clark, Samuel J and Chuang, Andrew Chihpin and Yu, Zhenzhen}, }