Nakkina, Tapan Ganatma, Karthikeyan, Adithyaa, Zhong, Yuhao, Eksin, Ceyhun, and Bukkapatnam, Satish TS. Learnings graph-Fourier spectra of textured surface images for defect localization. Retrieved from https://par.nsf.gov/biblio/10562162. Manufacturing Letters 41.S Web. doi:10.1016/j.mfglet.2024.09.183.

Nakkina, Tapan Ganatma, Karthikeyan, Adithyaa, Zhong, Yuhao, Eksin, Ceyhun, & Bukkapatnam, Satish TS. Learnings graph-Fourier spectra of textured surface images for defect localization. Manufacturing Letters, 41 (S). Retrieved from https://par.nsf.gov/biblio/10562162. https://doi.org/10.1016/j.mfglet.2024.09.183

Nakkina, Tapan Ganatma, Karthikeyan, Adithyaa, Zhong, Yuhao, Eksin, Ceyhun, and Bukkapatnam, Satish TS. "Learnings graph-Fourier spectra of textured surface images for defect localization". Manufacturing Letters 41 (S). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.mfglet.2024.09.183. https://par.nsf.gov/biblio/10562162.

@article{osti_10562162,
place = {Country unknown/Code not available}, title = {Learnings graph-Fourier spectra of textured surface images for defect localization}, url = {https://par.nsf.gov/biblio/10562162}, DOI = {10.1016/j.mfglet.2024.09.183}, abstractNote = {}, journal = {Manufacturing Letters}, volume = {41}, number = {S}, publisher = {Elsevier}, author = {Nakkina, Tapan Ganatma and Karthikeyan, Adithyaa and Zhong, Yuhao and Eksin, Ceyhun and Bukkapatnam, Satish TS}, }