Saurabh, Ayush, Brown, Peter T, Bryan_IV, J Shepard, Fox, Zachary R, Kruithoff, Rory, Thompson, Cristopher, Kural, Comert, Shepherd, Douglas P, and Pressé, Steve. Approaching maximum resolution in structured illumination microscopy via accurate noise modeling. Retrieved from https://par.nsf.gov/biblio/10570657. npj Imaging 3.1 Web. doi:10.1038/s44303-024-00066-8.

Saurabh, Ayush, Brown, Peter T, Bryan_IV, J Shepard, Fox, Zachary R, Kruithoff, Rory, Thompson, Cristopher, Kural, Comert, Shepherd, Douglas P, & Pressé, Steve. Approaching maximum resolution in structured illumination microscopy via accurate noise modeling. npj Imaging, 3 (1). Retrieved from https://par.nsf.gov/biblio/10570657. https://doi.org/10.1038/s44303-024-00066-8

Saurabh, Ayush, Brown, Peter T, Bryan_IV, J Shepard, Fox, Zachary R, Kruithoff, Rory, Thompson, Cristopher, Kural, Comert, Shepherd, Douglas P, and Pressé, Steve. "Approaching maximum resolution in structured illumination microscopy via accurate noise modeling". npj Imaging 3 (1). Country unknown/Code not available: Nature Publishing. https://doi.org/10.1038/s44303-024-00066-8. https://par.nsf.gov/biblio/10570657.

@article{osti_10570657,
place = {Country unknown/Code not available}, title = {Approaching maximum resolution in structured illumination microscopy via accurate noise modeling}, url = {https://par.nsf.gov/biblio/10570657}, DOI = {10.1038/s44303-024-00066-8}, abstractNote = {}, journal = {npj Imaging}, volume = {3}, number = {1}, publisher = {Nature Publishing}, author = {Saurabh, Ayush and Brown, Peter T and Bryan_IV, J Shepard and Fox, Zachary R and Kruithoff, Rory and Thompson, Cristopher and Kural, Comert and Shepherd, Douglas P and Pressé, Steve}, }