Li, Damond M, and Wang, Long. Development of a Portable and Low-Cost Data Acquisition System With Edge Intelligence for Electrical Impedance Tomography-Based Spatial Damage Detection. Retrieved from https://par.nsf.gov/biblio/10575636. IEEE Transactions on Instrumentation and Measurement 73. Web. doi:10.1109/TIM.2024.3470054.

Li, Damond M, & Wang, Long. Development of a Portable and Low-Cost Data Acquisition System With Edge Intelligence for Electrical Impedance Tomography-Based Spatial Damage Detection. IEEE Transactions on Instrumentation and Measurement, 73 (). Retrieved from https://par.nsf.gov/biblio/10575636. https://doi.org/10.1109/TIM.2024.3470054

Li, Damond M, and Wang, Long. "Development of a Portable and Low-Cost Data Acquisition System With Edge Intelligence for Electrical Impedance Tomography-Based Spatial Damage Detection". IEEE Transactions on Instrumentation and Measurement 73 (). Country unknown/Code not available: IEEE. https://doi.org/10.1109/TIM.2024.3470054. https://par.nsf.gov/biblio/10575636.

@article{osti_10575636,
place = {Country unknown/Code not available}, title = {Development of a Portable and Low-Cost Data Acquisition System With Edge Intelligence for Electrical Impedance Tomography-Based Spatial Damage Detection}, url = {https://par.nsf.gov/biblio/10575636}, DOI = {10.1109/TIM.2024.3470054}, abstractNote = {}, journal = {IEEE Transactions on Instrumentation and Measurement}, volume = {73}, publisher = {IEEE}, author = {Li, Damond M and Wang, Long}, }