Matavalam, Amar Ramapuram, Hou, Boya, Choi, Hyungjin, Bose, Subhonmesh, and Vaidya, Umesh. Data-driven transient stability analysis using the Koopman operator. Retrieved from https://par.nsf.gov/biblio/10575830. International Journal of Electrical Power & Energy Systems 162.C Web. doi:10.1016/j.ijepes.2024.110307.

Matavalam, Amar Ramapuram, Hou, Boya, Choi, Hyungjin, Bose, Subhonmesh, & Vaidya, Umesh. Data-driven transient stability analysis using the Koopman operator. International Journal of Electrical Power & Energy Systems, 162 (C). Retrieved from https://par.nsf.gov/biblio/10575830. https://doi.org/10.1016/j.ijepes.2024.110307

Matavalam, Amar Ramapuram, Hou, Boya, Choi, Hyungjin, Bose, Subhonmesh, and Vaidya, Umesh. "Data-driven transient stability analysis using the Koopman operator". International Journal of Electrical Power & Energy Systems 162 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.ijepes.2024.110307. https://par.nsf.gov/biblio/10575830.

@article{osti_10575830,
place = {Country unknown/Code not available}, title = {Data-driven transient stability analysis using the Koopman operator}, url = {https://par.nsf.gov/biblio/10575830}, DOI = {10.1016/j.ijepes.2024.110307}, abstractNote = {}, journal = {International Journal of Electrical Power & Energy Systems}, volume = {162}, number = {C}, publisher = {Elsevier}, author = {Matavalam, Amar Ramapuram and Hou, Boya and Choi, Hyungjin and Bose, Subhonmesh and Vaidya, Umesh}, }