Abstract Multilevel diffractive lenses (MDLs) have emerged as an alternative to both conventional diffractive optical elements (DOEs) and metalenses for applications ranging from imaging to holographic and immersive displays. Recent work has shown that by harnessing structural parametric optimization of DOEs, one can design MDLs to enable multiple functionalities like achromaticity, depth of focus, wide-angle imaging, etc. with great ease in fabrication. Therefore, it becomes critical to understand how fabrication errors still do affect the performance of MDLs and numerically evaluate the trade-off between efficiency and initial parameter selection, right at the onset of designing an MDL, i.e., even before putting it into fabrication. Here, we perform a statistical simulation-based study on MDLs (primarily operating in the THz regime) to analyse the impact of various fabrication imperfections (single and multiple) on the final structure as a function of the number of ring height levels. Furthermore, we also evaluate the performance of these same MDLs with the change in the refractive index of the constitutive material. We use focusing efficiency as the evaluation criterion in our numerical analysis; since it is the most fundamental property that can be used to compare and assess the performance of lenses (and MDLs) in general designed for any application with any specific functionality.
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Fabrication-conscious neural network based inverse design of single-material variable-index multilayer films
Multilayer films with continuously varying indices for each layer have attracted great deal of attention due to their superior optical, mechanical, and thermal properties. However, difficulties in fabrication have limited their application and study in scientific literature compared to multilayer films with fixed index layers. In this work we propose a neural network based inverse design technique enabled by a differentiable analytical solver for realistic design and fabrication of single material variable-index multilayer films. This approach generates multilayer films with excellent performance under ideal conditions. We furthermore address the issue of how to translate these ideal designs into practical useful devices which will naturally suffer from growth imperfections. By integrating simulated systematic and random errors just as a deposition tool would into the optimization process, we demonstrated that the same neural network that produced the ideal device can be retrained to produce designs compensating for systematic deposition errors. Furthermore, the proposed approach corrects for systematic errors even in the presence of random fabrication imperfections. The results outlined in this paper provide a practical and experimentally viable approach for the design of single material multilayer film stacks for an extremely wide variety of practical applications with high performance.
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- Award ID(s):
- 2029553
- PAR ID:
- 10578876
- Publisher / Repository:
- De Gruyter
- Date Published:
- Journal Name:
- Nanophotonics
- Volume:
- 12
- Issue:
- 5
- ISSN:
- 2192-8614
- Page Range / eLocation ID:
- 993 to 1006
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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