Nikpey, Hesam, Kim, Jungyeol, Chen, Xingran, Sarkar, Saswati, and Bidokhti, Shirin Saeedi. Group Testing With Correlation Under Edge-Faulty Graphs. Retrieved from https://par.nsf.gov/biblio/10583283. IEEE Transactions on Information Theory 70.12 Web. doi:10.1109/TIT.2024.3475822.

Nikpey, Hesam, Kim, Jungyeol, Chen, Xingran, Sarkar, Saswati, & Bidokhti, Shirin Saeedi. Group Testing With Correlation Under Edge-Faulty Graphs. IEEE Transactions on Information Theory, 70 (12). Retrieved from https://par.nsf.gov/biblio/10583283. https://doi.org/10.1109/TIT.2024.3475822

Nikpey, Hesam, Kim, Jungyeol, Chen, Xingran, Sarkar, Saswati, and Bidokhti, Shirin Saeedi. "Group Testing With Correlation Under Edge-Faulty Graphs". IEEE Transactions on Information Theory 70 (12). Country unknown/Code not available: IEEE. https://doi.org/10.1109/TIT.2024.3475822. https://par.nsf.gov/biblio/10583283.

@article{osti_10583283,
place = {Country unknown/Code not available}, title = {Group Testing With Correlation Under Edge-Faulty Graphs}, url = {https://par.nsf.gov/biblio/10583283}, DOI = {10.1109/TIT.2024.3475822}, abstractNote = {}, journal = {IEEE Transactions on Information Theory}, volume = {70}, number = {12}, publisher = {IEEE}, author = {Nikpey, Hesam and Kim, Jungyeol and Chen, Xingran and Sarkar, Saswati and Bidokhti, Shirin Saeedi}, }