Roy, Sourav, Cannon, Andrew, de_la_Mata, Luis, Yu_Acharya, Rabin, Farheen, Tasnuva, Tajik, Shahin, and Forte, Domenic. Sense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical Attacks. Retrieved from https://par.nsf.gov/biblio/10587034. IEEE Transactions on Very Large Scale Integration (VLSI) Systems . Web. doi:10.1109/TVLSI.2025.3550431.

Roy, Sourav, Cannon, Andrew, de_la_Mata, Luis, Yu_Acharya, Rabin, Farheen, Tasnuva, Tajik, Shahin, & Forte, Domenic. Sense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical Attacks. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (). Retrieved from https://par.nsf.gov/biblio/10587034. https://doi.org/10.1109/TVLSI.2025.3550431

Roy, Sourav, Cannon, Andrew, de_la_Mata, Luis, Yu_Acharya, Rabin, Farheen, Tasnuva, Tajik, Shahin, and Forte, Domenic. "Sense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical Attacks". IEEE Transactions on Very Large Scale Integration (VLSI) Systems (). Country unknown/Code not available: IEEE. https://doi.org/10.1109/TVLSI.2025.3550431. https://par.nsf.gov/biblio/10587034.

@article{osti_10587034,
place = {Country unknown/Code not available}, title = {Sense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical Attacks}, url = {https://par.nsf.gov/biblio/10587034}, DOI = {10.1109/TVLSI.2025.3550431}, abstractNote = {}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, publisher = {IEEE}, author = {Roy, Sourav and Cannon, Andrew and de_la_Mata, Luis and Yu_Acharya, Rabin and Farheen, Tasnuva and Tajik, Shahin and Forte, Domenic}, }