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Title: Estimating illumination coherence width from focused-probe intensity profiles
Fluctuation Electron Microscopy (FEM) examines speckle in images and diffraction patterns that arises from constructive and destructive interferences between the waves scattered by atoms in the thin material. Strong coherence between the scattered waves is necessary if structural correlations between those atoms is to be detected [1]. High spatial coherence in the illumination is crucial.  more » « less
Award ID(s):
1906367
PAR ID:
10589394
Author(s) / Creator(s):
; ; ; ;
Publisher / Repository:
Microscopy and Microanalysis
Date Published:
Journal Name:
Microscopy and Microanalysis
Volume:
27
Issue:
S1
ISSN:
1431-9276
Page Range / eLocation ID:
738 to 740
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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