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While the existence of a non-integer train station platform in the Harry Potter series is a source of delightful whimsy, the reality of electron detectors registering non-integer electrons can be a headache for electron microscopists worried about non-Poisson noise. Although there is no such thing as ¾ of an electron, when an electron enters a pixel in a direct electron detector, the signal energy can spread into neighboring pixels [1], giving a fractional signal. This seemingly innocent effect is a serious problem for Fluctuation Electron Microscopy (FEM) when attempting to correct Poisson noise in low- uence experiments [2]. The Poisson distribution applies strictly to countable discrete events.more » « less
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Fluctuation Electron Microscopy (FEM) is a versatile technique for detecting subtle traces of ordering in amorphous and glassy materials [1–4]. However, quantitative results remained elusive, mainly because experimental variance data disagree with theory by several orders of magnitude. The reasons for this discrepancy are still a mystery. We present a preliminary report on what we know.more » « less
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Fluctuation Electron Microscopy (FEM) examines the scattering statistics from small volumes of thin amorphous materials in order to learn subtle details about any medium-range order (MRO) that may be present [1–4]. Both modeling and simulations show that FEM is extraordinarily sensitive to the presence of MRO, much more so than high-resolution diffraction and high-resolution imaging. The essence of FEM is to measure the 'speckliness' of diffraction (or image) data from small regions of the sample.more » « less
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Fluctuation Electron Microscopy (FEM) examines speckle in images and diffraction patterns that arises from constructive and destructive interferences between the waves scattered by atoms in the thin material. Strong coherence between the scattered waves is necessary if structural correlations between those atoms is to be detected [1]. High spatial coherence in the illumination is crucial.more » « less
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