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Among ABO3 perovskites, SrMoO3 possesses the lowest electrical resistivity in addition to having high optical transparency in the visible spectrum. This unusual combination of material properties allows it to be a potential replacement for indium tin oxide as a transparent electrode. Thus far, its thin film synthesis has been challenging and limited primarily to pulsed laser deposition and sputtering. Here, we report the growth of SrMoO3 thin films by suboxide molecular beam epitaxy. We demonstrate that optically transparent and conductive SrMoO3 films can be grown by supplying elemental strontium via a conventional effusion cell and thermally evaporating MoO3 pellets as a molybdenum source. The direct supply of a molecular oxygen flux to the MoO3 charge was utilized to prevent reduction to lower oxidation states of the charge to ensure congruent evaporation and, thus, a stable MoO3 molecular flux. The optimal growth conditions were found by varying the Sr to MoO3 flux ratio determined from quartz crystal microbalance measurements and monitoring the growth by reflection high-energy electron diffraction. SrMoO3 thin films with 21 nm thickness were confirmed to be optically transparent with transmission between 75 and 91% throughout the visible spectral range and electrically conducting with a room temperature resistivity of 5.0 × 10−5 Ω cm. This realization of this thin film growth method can be further expanded to the growth of other transition metal perovskites in which cations have extremely low vapor pressure and cannot be evaporated in elemental forms.
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Growth and Performance of Perovskite Semiconductor CsPbX3 (X = Cl, Br, I, or Mixed Halide) for Detection and Imaging Applications
The material family halide perovskites has been critical in recent room-temperature radiation detection semiconductor research. Cesium lead bromide (CsPbBr3) is a halide perovskite that exhibits characteristics of a semiconductor that would be suitable for applications in various fields. In this paper, we report on the correlations between material purification and crystal material properties. Crystal boules of CsPbX3 (where X = Cl, Br, I, or mixed) were grown with the Bridgman growth method. We describe in great detail the fabrication techniques used to prepare sample surfaces for contact deposition and sample testing. Current–voltage measurements, UV–Vis and photocurrent spectroscopy, as well as photoluminescence measurements, were carried out for material characterization. Bulk resistivity values of up to 3.0 × 109 Ω∙cm and surface resistivity values of 1.3 × 1011 Ω/□ indicate that the material can be used for low-noise semiconductor detector applications. Preliminary radiation detectors were fabricated, and using photocurrent measurements we have estimated a value of the mobility–lifetime product for holes (μτ)h of 2.8 × 10−5 cm2/V. The results from the sample testing can shed light on ways to improve the crystal properties for future work, not only for CsPbX3 but also other halide perovskites.
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- Award ID(s):
- 2112556
- PAR ID:
- 10593300
- Publisher / Repository:
- MDPI
- Date Published:
- Journal Name:
- Materials
- Volume:
- 17
- Issue:
- 21
- ISSN:
- 1996-1944
- Page Range / eLocation ID:
- 5360
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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