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Six periods of 2-nm-thick In0.15Ga0.85N/13-nm-thick GaN blue emitting multi-quantum-well (MQW) layers are grown on sapphire (Al2O3) and silicon (Si) substrates. X-ray diffraction, Raman spectroscopy, atomic force microscopy, temperature-dependent photoluminescence (PL), Micro-PL, and time-resolved PL are used to compare the structural and optical properties, and the carrier dynamics of the blue emitting active layers grown on Al2O3 and Si substrates. Indium clustering in the MQW layers is observed to be more pronounced on Al2O3 than those on Si as revealed through investigating band-filling effects of emission centers, S-shaped peak emission energy shifts with increasing temperature, and PL intensity-peak energy spatial nonuniformity correlations. The smaller indium clustering effects in MQW on Si are attributed to the residual tensile strain in the GaN buffer layer, which decreases the compressive strain and thus the piezoelectric polarization field in the InGaN quantum wells. Despite a 30% thinner total epitaxial thickness of 3.3 µm, MQW on Si exhibits a higher IQE than those on Al2O3 in terms of internal quantum efficiency (IQE) at temperatures below 250 K, and a similar IQE at 300 K (30% vs 33%). These results show that growth of blue emitting MQW layers on Si is a promising approach compared to those conventionally grown on Al2O3.
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Strain compensation in InGaN-based multiple quantum wells using AlGaN interlayers
Data are presented on strain compensation in InGaN-based multiple quantum wells (MQW) using AlGaN interlayers (ILs). The MQWs consist of five periods of InxGa1-xN/AlyGa1-yN/GaN emitting in the green (λ ∼ 535 nm ± 15 nm), and the AlyGa1-yN IL has an Al composition of y = 0.42. The IL is varied from 0 - 2.1 nm, and the relaxation of the MQW with respect to the GaN template layer varies with IL thickness as determined by reciprocal space mapping about the (202¯5) reflection. The minimum in the relaxation occurs at an interlayer thickness of 1 nm, and the MQW is nearly pseudomorphic to GaN. Both thinner and thicker ILs display increased relaxation. Photoluminescence data shows enhanced spectral intensity and narrower full width at half maximum for the MQW with 1 nm thick ILs, which is a product of pseudomorphic layers with lower defect density and non-radiative recombination.
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- Award ID(s):
- 1708227
- PAR ID:
- 10597548
- Publisher / Repository:
- American Institute of Physics
- Date Published:
- Journal Name:
- AIP Advances
- Volume:
- 7
- Issue:
- 10
- ISSN:
- 2158-3226
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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