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This content will become publicly available on March 1, 2026

Title: High-precision thermal characterization technique with dual-laser Raman thermometry
Effective heat management plays a vital role in ensuring the performance and reliability of nanoelectronic devices. Here, we present a new practical approach for thermal characterization: The dual laser at same side Raman technique. This method is not only straightforward and reliable but also delivers accurate thermal property measurements. To demonstrate its capabilities, we applied the technique to bulk graphite and measured a thermal conductivity of 467 ± 86 W/(m K). This technique holds potential for measuring direction-dependent thermal conductivity, offering a promising avenue for future investigations.  more » « less
Award ID(s):
2145417 2137883
PAR ID:
10610446
Author(s) / Creator(s):
;
Publisher / Repository:
AVS
Date Published:
Journal Name:
Journal of Vacuum Science & Technology B
Volume:
43
Issue:
2
ISSN:
2166-2746
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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