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Optimizing Hafnium Oxide Thin-Film Dielectrics: Developing a Novel Atomic Layer Deposition Recipe
- Award ID(s):
- 2235385
- PAR ID:
- 10615718
- Publisher / Repository:
- IEEE
- Date Published:
- ISBN:
- 979-8-3315-2946-8
- Page Range / eLocation ID:
- 1 to 4
- Format(s):
- Medium: X
- Location:
- Bologna, Italy
- Sponsoring Org:
- National Science Foundation
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