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  • High-Performance TiO 2 Thin-Film Transistors: In-Depth Investigation of the Correlation between Interface Traps and Oxygen Vacancies
Title: High-Performance TiO 2 Thin-Film Transistors: In-Depth Investigation of the Correlation between Interface Traps and Oxygen Vacancies
Award ID(s):
2239302
PAR ID:
10623887
Author(s) / Creator(s):
; ; ; ; ;
Publisher / Repository:
ACS
Date Published:
Journal Name:
ACS Applied Electronic Materials
ISSN:
2637-6113
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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