Jiang, Zhouhang, Xiao, Yi, Weling, Milind, Mulaosmanovic, Halid, Duenkel, Stefan, Kleimaier, Dominik, Soss, Steven, Beyer, Sven, Joshi, Rajiv, Mohamed, Mohamed, Meninger, Scott, Gong, Xiao, Narayanan, Vijaykrishnan, and Ni, Kai. On the Origin of Holes During Polarization Reset in Floating Body Ferroelectric FETs Towards Improving Switching Efficiency. Retrieved from https://par.nsf.gov/biblio/10632388. Web. doi:10.1109/IEDM50854.2024.10873452.

Jiang, Zhouhang, Xiao, Yi, Weling, Milind, Mulaosmanovic, Halid, Duenkel, Stefan, Kleimaier, Dominik, Soss, Steven, Beyer, Sven, Joshi, Rajiv, Mohamed, Mohamed, Meninger, Scott, Gong, Xiao, Narayanan, Vijaykrishnan, & Ni, Kai. On the Origin of Holes During Polarization Reset in Floating Body Ferroelectric FETs Towards Improving Switching Efficiency. Retrieved from https://par.nsf.gov/biblio/10632388. https://doi.org/10.1109/IEDM50854.2024.10873452

Jiang, Zhouhang, Xiao, Yi, Weling, Milind, Mulaosmanovic, Halid, Duenkel, Stefan, Kleimaier, Dominik, Soss, Steven, Beyer, Sven, Joshi, Rajiv, Mohamed, Mohamed, Meninger, Scott, Gong, Xiao, Narayanan, Vijaykrishnan, and Ni, Kai. "On the Origin of Holes During Polarization Reset in Floating Body Ferroelectric FETs Towards Improving Switching Efficiency". Country unknown/Code not available: IEEE. https://doi.org/10.1109/IEDM50854.2024.10873452. https://par.nsf.gov/biblio/10632388.

@article{osti_10632388,
place = {Country unknown/Code not available}, title = {On the Origin of Holes During Polarization Reset in Floating Body Ferroelectric FETs Towards Improving Switching Efficiency}, url = {https://par.nsf.gov/biblio/10632388}, DOI = {10.1109/IEDM50854.2024.10873452}, abstractNote = {}, journal = {}, publisher = {IEEE}, author = {Jiang, Zhouhang and Xiao, Yi and Weling, Milind and Mulaosmanovic, Halid and Duenkel, Stefan and Kleimaier, Dominik and Soss, Steven and Beyer, Sven and Joshi, Rajiv and Mohamed, Mohamed and Meninger, Scott and Gong, Xiao and Narayanan, Vijaykrishnan and Ni, Kai}, }