Han, Yimo, Shi, Chuqiao, Li, Xinyan, Mao, Nannan, Jiang, Yi, and Kong, Jing. Probing Strain, Stacking, and Switching of van der Walls Materials using 4D-STEM. Retrieved from https://par.nsf.gov/biblio/10632463. Microscopy and Microanalysis 31.Supplement_1 Web. doi:10.1093/mam/ozaf048.065.

Han, Yimo, Shi, Chuqiao, Li, Xinyan, Mao, Nannan, Jiang, Yi, & Kong, Jing. Probing Strain, Stacking, and Switching of van der Walls Materials using 4D-STEM. Microscopy and Microanalysis, 31 (Supplement_1). Retrieved from https://par.nsf.gov/biblio/10632463. https://doi.org/10.1093/mam/ozaf048.065

Han, Yimo, Shi, Chuqiao, Li, Xinyan, Mao, Nannan, Jiang, Yi, and Kong, Jing. "Probing Strain, Stacking, and Switching of van der Walls Materials using 4D-STEM". Microscopy and Microanalysis 31 (Supplement_1). Country unknown/Code not available: Oxford University Press. https://doi.org/10.1093/mam/ozaf048.065. https://par.nsf.gov/biblio/10632463.

@article{osti_10632463,
place = {Country unknown/Code not available}, title = {Probing Strain, Stacking, and Switching of van der Walls Materials using 4D-STEM}, url = {https://par.nsf.gov/biblio/10632463}, DOI = {10.1093/mam/ozaf048.065}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {31}, number = {Supplement_1}, publisher = {Oxford University Press}, author = {Han, Yimo and Shi, Chuqiao and Li, Xinyan and Mao, Nannan and Jiang, Yi and Kong, Jing}, }