Zhou, Ranyang, Liu, Jacqueline, Kochar, Nakul, Ahmed, Sabbir, Siraj_Rakin, Adnan, and Angizi, Shaahin. A Novel Insight Into the Vulnerability of DDR4 DRAM Cells Across Multiple Hammering Settings. Retrieved from https://par.nsf.gov/biblio/10634404. IEEE Embedded Systems Letters 16.4 Web. doi:10.1109/LES.2024.3449232.

Zhou, Ranyang, Liu, Jacqueline, Kochar, Nakul, Ahmed, Sabbir, Siraj_Rakin, Adnan, & Angizi, Shaahin. A Novel Insight Into the Vulnerability of DDR4 DRAM Cells Across Multiple Hammering Settings. IEEE Embedded Systems Letters, 16 (4). Retrieved from https://par.nsf.gov/biblio/10634404. https://doi.org/10.1109/LES.2024.3449232

Zhou, Ranyang, Liu, Jacqueline, Kochar, Nakul, Ahmed, Sabbir, Siraj_Rakin, Adnan, and Angizi, Shaahin. "A Novel Insight Into the Vulnerability of DDR4 DRAM Cells Across Multiple Hammering Settings". IEEE Embedded Systems Letters 16 (4). Country unknown/Code not available: IEEE. https://doi.org/10.1109/LES.2024.3449232. https://par.nsf.gov/biblio/10634404.

@article{osti_10634404,
place = {Country unknown/Code not available}, title = {A Novel Insight Into the Vulnerability of DDR4 DRAM Cells Across Multiple Hammering Settings}, url = {https://par.nsf.gov/biblio/10634404}, DOI = {10.1109/LES.2024.3449232}, abstractNote = {}, journal = {IEEE Embedded Systems Letters}, volume = {16}, number = {4}, publisher = {IEEE}, author = {Zhou, Ranyang and Liu, Jacqueline and Kochar, Nakul and Ahmed, Sabbir and Siraj_Rakin, Adnan and Angizi, Shaahin}, }