This content will become publicly available on January 1, 2026
Performance and Scalability of Strain Engineered 2D MoTe 2 Phase-Change Memristors
- PAR ID:
- 10643100
- Publisher / Repository:
- IEEE
- Date Published:
- Journal Name:
- IEEE Journal of the Electron Devices Society
- Volume:
- 13
- ISSN:
- 2168-6734
- Page Range / eLocation ID:
- 343 to 349
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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