Su, Haotian, Lee, Yuan-Mau, Peña, Tara, Fultz-Waters, Sydney, Kang, Jimin, Köroğlu, Çağıl, Wahid, Sumaiya, Newcomb, Christina J, Song, Young Suh, Wong, H-S Philip, Wang, Shan X, and Pop, Eric. High-Field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors. Retrieved from https://par.nsf.gov/biblio/10654007. ACS Nano 19.17 Web. doi:10.1021/acsnano.5c01572.

Su, Haotian, Lee, Yuan-Mau, Peña, Tara, Fultz-Waters, Sydney, Kang, Jimin, Köroğlu, Çağıl, Wahid, Sumaiya, Newcomb, Christina J, Song, Young Suh, Wong, H-S Philip, Wang, Shan X, & Pop, Eric. High-Field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors. ACS Nano, 19 (17). Retrieved from https://par.nsf.gov/biblio/10654007. https://doi.org/10.1021/acsnano.5c01572

Su, Haotian, Lee, Yuan-Mau, Peña, Tara, Fultz-Waters, Sydney, Kang, Jimin, Köroğlu, Çağıl, Wahid, Sumaiya, Newcomb, Christina J, Song, Young Suh, Wong, H-S Philip, Wang, Shan X, and Pop, Eric. "High-Field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors". ACS Nano 19 (17). Country unknown/Code not available: American Chemical Society. https://doi.org/10.1021/acsnano.5c01572. https://par.nsf.gov/biblio/10654007.

@article{osti_10654007,
place = {Country unknown/Code not available}, title = {High-Field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors}, url = {https://par.nsf.gov/biblio/10654007}, DOI = {10.1021/acsnano.5c01572}, abstractNote = {Not Available}, journal = {ACS Nano}, volume = {19}, number = {17}, publisher = {American Chemical Society}, author = {Su, Haotian and Lee, Yuan-Mau and Peña, Tara and Fultz-Waters, Sydney and Kang, Jimin and Köroğlu, Çağıl and Wahid, Sumaiya and Newcomb, Christina J and Song, Young Suh and Wong, H-S Philip and Wang, Shan X and Pop, Eric}, }