Doherty, James L, Smith, Brittany N, Albarghouthi, Faris M, Vazquez-Perez, Rubimarie, and Franklin, Aaron D. Evaluating Uniformity, Contact Geometries, and Size Scaling in Carbon Nanotube Thin-Film Transistors. Retrieved from https://par.nsf.gov/biblio/10657092. ACS Nano 19.36 Web. doi:10.1021/acsnano.5c07890.

Doherty, James L, Smith, Brittany N, Albarghouthi, Faris M, Vazquez-Perez, Rubimarie, & Franklin, Aaron D. Evaluating Uniformity, Contact Geometries, and Size Scaling in Carbon Nanotube Thin-Film Transistors. ACS Nano, 19 (36). Retrieved from https://par.nsf.gov/biblio/10657092. https://doi.org/10.1021/acsnano.5c07890

Doherty, James L, Smith, Brittany N, Albarghouthi, Faris M, Vazquez-Perez, Rubimarie, and Franklin, Aaron D. "Evaluating Uniformity, Contact Geometries, and Size Scaling in Carbon Nanotube Thin-Film Transistors". ACS Nano 19 (36). Country unknown/Code not available: ACS. https://doi.org/10.1021/acsnano.5c07890. https://par.nsf.gov/biblio/10657092.

@article{osti_10657092,
place = {Country unknown/Code not available}, title = {Evaluating Uniformity, Contact Geometries, and Size Scaling in Carbon Nanotube Thin-Film Transistors}, url = {https://par.nsf.gov/biblio/10657092}, DOI = {10.1021/acsnano.5c07890}, abstractNote = {Not Available}, journal = {ACS Nano}, volume = {19}, number = {36}, publisher = {ACS}, author = {Doherty, James L and Smith, Brittany N and Albarghouthi, Faris M and Vazquez-Perez, Rubimarie and Franklin, Aaron D}, }