Chen, Yuhang, Tan, Zhen, Jaiswal, Ajay, Qu, Huaizhi, Zhao, Xinyu, Lin, Qi, Cheng, Yu, Kwong, Andrew, Cao, Zhichao, and Chen, Tianlong. Bit-Flip Error Resilience in LLMs: A Comprehensive Analysis and Defense Framework. Retrieved from https://par.nsf.gov/biblio/10657531.

Chen, Yuhang, Tan, Zhen, Jaiswal, Ajay, Qu, Huaizhi, Zhao, Xinyu, Lin, Qi, Cheng, Yu, Kwong, Andrew, Cao, Zhichao, & Chen, Tianlong. Bit-Flip Error Resilience in LLMs: A Comprehensive Analysis and Defense Framework. Retrieved from https://par.nsf.gov/biblio/10657531.

Chen, Yuhang, Tan, Zhen, Jaiswal, Ajay, Qu, Huaizhi, Zhao, Xinyu, Lin, Qi, Cheng, Yu, Kwong, Andrew, Cao, Zhichao, and Chen, Tianlong. "Bit-Flip Error Resilience in LLMs: A Comprehensive Analysis and Defense Framework". Country unknown/Code not available: Proceedings of the 2025 Conference on Empirical Methods in Natural Language Processing. https://par.nsf.gov/biblio/10657531.

@article{osti_10657531,
place = {Country unknown/Code not available}, title = {Bit-Flip Error Resilience in LLMs: A Comprehensive Analysis and Defense Framework}, url = {https://par.nsf.gov/biblio/10657531}, abstractNote = {}, journal = {}, publisher = {Proceedings of the 2025 Conference on Empirical Methods in Natural Language Processing}, author = {Chen, Yuhang and Tan, Zhen and Jaiswal, Ajay and Qu, Huaizhi and Zhao, Xinyu and Lin, Qi and Cheng, Yu and Kwong, Andrew and Cao, Zhichao and Chen, Tianlong}, }