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Epitaxial films of cubic boron nitride (c-BN) have been grown on single-crystal boron-doped diamond substrates by electron cyclotron resonance plasma-enhanced chemical vapor deposition using gas mixtures of Ar–He–N2–BF3–H2. The resulting c-BN films have been characterized using in situ x-ray photoelectron spectroscopy to establish the growth surface bonding (i.e., sp3 or sp2). The interface and film crystal structure were characterized with high resolution electron microscopy and electron-energy-loss spectroscopy. This study considers three stages of the growth process: in situ surface preparation, initial nucleation and growth of c-BN, and growth of the epitaxial c-BN layer. Prior studies from our group have established that hydrogen gas phase concentration affects fluorine-induced etching and c-BN nucleation. The results of this study establish that by optimizing the surface chemistry for all three stages of the growth process, it is possible to achieve an adherent, oriented epitaxial c-BN layer, a workable growth rate (∼50 nm/hr), cubic phase BN throughout, and negligible sp2 bonding except at the interface. 

We report the growth of AlBN/β‐Nb₂N nitride epitaxial heterostructures in which the AlBN is ferroelectric, and β‐Nb₂N with metallic resistivity ≈40 μ at 300 K becomes superconducting belowT_C ≈ 0.5 K. Using nitrogen plasma molecular beam epitaxy, we grow hexagonal β‐Nb₂N films on c‐plane Al₂O₃substrates, followed by wurtzite AlBN. The AlBN is in epitaxial registry and rotationally aligned with the β‐Nb₂N, and the hexagonal lattices of both nitride layers make angles of 30° with the hexagonal lattice of the Al₂O₃substrate. The B composition of the AlBN layer is varied from 0 to 14.7%. It is found to depend weakly on the B flux, but increases strongly with decreasing growth temperature, indicating a reaction rate‐controlled growth. The increase in B content causes a non‐monotonic change in the a‐lattice constant and a monotonic decrease in the c‐lattice constant of AlBN. Sharp, abrupt epitaxial AlBN/β‐Nb₂N/Al₂O₃heterojunction interfaces and close symmetry matching are observed by transmission electron microscopy. The observation of ferroelectricity and superconductivity in epitaxial nitride heterostructures opens avenues for novel electronic and quantum devices. 

Cubic boron nitride (c-BN), with a small 1.4% lattice mismatch with diamond, presents a heterostructure with multiple opportunities for electronic device applications. However, the formation of c-BN/diamond heterostructures has been limited by the tendency to form hexagonal BN at the interface. In this study, c-BN has been deposited on free standing polycrystalline and single crystal boron-doped diamond substrates via electron cyclotron resonance plasma enhanced chemical vapor deposition (ECR-PECVD), employing fluorine chemistry. In situ x-ray photoelectron spectroscopy (XPS) is used to characterize the nucleation and growth of boron nitride (BN) films as a function of hydrogen gas flow rates during deposition. The PECVD growth rate of BN was found to increase with increased hydrogen gas flow. In the absence of hydrogen gas flow, the BN layer was reduced in thickness or etched. The XPS results show that an excess of hydrogen gas significantly increases the percent of sp2 bonding, characteristic of hexagonal BN (h-BN), particularly during initial layer growth. Reducing the hydrogen flow, such that hydrogen gas is the limiting reactant, minimizes the sp2 bonding during the nucleation of BN. TEM results indicate the partial coverage of the diamond with thin epitaxial islands of c-BN. The limited hydrogen reaction is found to be a favorable growth environment for c-BN on boron-doped diamond.