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Chemical doping is a key process for controlling the electronic properties of molecular semiconductors, including their conductivity and work function. A common limitation of n-doped polymers is their instability under ambient conditions, which has imposed restrictions on the characterisation and device application of n-doped polymers. In this study, sequential n-doping with organometallic dopants was performed on thin films of polymeric semiconductors with naphthalene diimide and perylene diimide-based backbones. Moderate ambient stability was achieved with (RuCp*Mes) 2 , {Cp* = pentamethylcyclopentadienyl; Mes = 1,3,5-trimethylbenzene}, which is in striking contrast to the unstable, n-doped state obtained with cobaltocene, a simple one-electron reductant. The highly cathodic, effective redox potential of (RuCp*Mes) 2 , ca. −2.0 V vs. ferrocene, suppresses the back electron transfer reaction and the subsequent dopant loss in air, which gives rise to the observed air stability. It also allows a perylene diimide-based polymer to be reduced to a state in which the repeat units are largely dianionic. Photoelectron measurements show that the ionization potential of the heavily doped polymer is ca. 3.9 eV. Our findings show that chemical doping with (RuCp*Mes) 2 is an effective method to produce highly stable, n-doped conjugated polymers. 

Electronic technologies critically rely on the ability to broadly dope the active semiconductor; yet the promising class of halide perovskite semiconductors so far does not allow for significant control over carrier type (p- or n-) and density. The molecular doping approach offers important opportunities for generating free carriers through charge transfer. In this work, we demonstrate effective p-doping of MAPb 0.5 Sn 0.5 I 3 films using the molecular dopant F4TCNQ as a grain boundary coating, offering a conductivity and hole density tuning range of up to five orders of magnitude, associated with a 190 meV Fermi level down-shift. While charge transfer between MAPb 0.5 Sn 0.5 I 3 and F4TCNQ appears efficient, dopant ionization decreases with increasing Pb content, highlighting the need for appropriate energy offset between host and dopant molecule. Finally, we show that electrical p-doping impacts the perovskite optoelectronic properties, with a hole recombination lifetime increase of over one order of magnitude, suggesting passivation of deep traps.