- Home
- Search Results
- Page 1 of 1
Search for: All records
-
Total Resources4
- Resource Type
-
0000000004000000
- More
- Availability
-
40
- Author / Contributor
- Filter by Author / Creator
-
-
Fei, Zhe (3)
-
Luan, Yilong (3)
-
Chen, S. (1)
-
Chi, Y. (1)
-
Fei, Z. (1)
-
Fralaide, M. (1)
-
Ho, Kai-Ming (1)
-
Iyer, R. B. (1)
-
Kim, Minsung (1)
-
Kolmer, M. (1)
-
Kolmer, Marek (1)
-
Li, Yun (1)
-
Luan, Y. (1)
-
Qian, Jun (1)
-
Shi, Yi (1)
-
Shinar, J. (1)
-
Shinar, R. (1)
-
Sutter, Eli (1)
-
Sutter, Peter (1)
-
Tringides, M. C. (1)
-
- Filter by Editor
-
-
& Spizer, S. M. (0)
-
& . Spizer, S. (0)
-
& Ahn, J. (0)
-
& Bateiha, S. (0)
-
& Bosch, N. (0)
-
& Brennan K. (0)
-
& Brennan, K. (0)
-
& Chen, B. (0)
-
& Chen, Bodong (0)
-
& Drown, S. (0)
-
& Ferretti, F. (0)
-
& Higgins, A. (0)
-
& J. Peters (0)
-
& Kali, Y. (0)
-
& Ruiz-Arias, P.M. (0)
-
& S. Spitzer (0)
-
& Sahin. I. (0)
-
& Spitzer, S. (0)
-
& Spitzer, S.M. (0)
-
(submitted - in Review for IEEE ICASSP-2024) (0)
-
-
Have feedback or suggestions for a way to improve these results?
!
Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
We report on a nano-infrared (IR) imaging and spectroscopy study of epitaxial graphene on silicon carbide (SiC) by using scattering-type scanning near-field optical microscopy (s-SNOM). With nano-IR imaging, we reveal in real space microscopic domains with distinct IR contrasts. By analyzing the nano-IR, atomic force microscopy, and scanning tunneling microscopy imaging data, we conclude that the imaged domains correspond to single-layer graphene, bilayer graphene (BLG), and higher-doped BLG. With nano-IR spectroscopy, we find that graphene can screen the SiC phonon resonance, and the screening is stronger at more conductive sample regions. Our work offers insights into the rich surface properties of epitaxial graphene and demonstrates s-SNOM as an efficient and effective tool in characterizing graphene and possibly other two-dimensional materials.more » « less
-
Luan, Yilong; Kolmer, Marek; Tringides, Michael C.; Fei, Zhe (, Physical Review B)
-
Luan, Yilong; Zobeiri, Hamidreza; Wang, Xinwei; Sutter, Eli; Sutter, Peter; Fei, Zhe (, Nano Letters)
-
Qian, Jun; Luan, Yilong; Kim, Minsung; Ho, Kai-Ming; Shi, Yi; Wang, Cai-Zhuang; Li, Yun; Fei, Zhe (, Physical Review B)
An official website of the United States government
