Self-Awareness in Systems on Chip— A Survey
- Award ID(s):
- 1704859
- PAR ID:
- 10076102
- Date Published:
- Journal Name:
- IEEE Design & Test
- Volume:
- 34
- Issue:
- 6
- ISSN:
- 2168-2356
- Page Range / eLocation ID:
- 8 to 26
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1109/MDAT.2017.2757143
