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Title: Inexpensive Verification via Electromechanical Impedance for Additively Manufactured Parts
Currently, verifying additively manufactured (AM) parts requires time consuming and expensive nondestructive evaluation (NDE) processes such as computed tomography (CT) x-ray scanning. While such methods provide details on flaw type and location, they require significant cost and time. Often, in production environments, significant value is gained by rapidly screening part specimens for flaws at all. Cost-effective per-specimen testing for production runs of AM parts is important for their use to be economically justified. In this work, Northrop Grumman Corporation and Virginia Tech explored impedance-based testing as a means to evaluate AM titanium specimens. Specimens with and without manually-designed flaws were fabricated through a metal- based AM process and evaluated using the impedance-based technique. CT scans confirmed that the intended flaws in the experimental specimens were present. Impedance-based examination also showed the presence of unintended defects. After machining away the unintended defective regions, the flaw-containing defective specimen had a clearly different impedance ‘signature’ than non-flawed baseline specimens. Additional analysis confirmed that the impedance test method required cheaper capital equipment and required less technician time to examine test results. Taken together, this means that the impedance-based this method can reduce the total cost of utilizing AM for metal part manufacturing.  more » « less
Award ID(s):
1635356
NSF-PAR ID:
10079245
Author(s) / Creator(s):
Date Published:
Journal Name:
SAMPE Conference
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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