Lewis, Ronald M., Jackson, Grayson L., Maher, Michael J., Kim, Kyungtae, Lodge, Timothy P., Mahanthappa, Mahesh K., Narayanan, Suresh, and Bates, Frank S. A new framework for X-ray photon correlation spectroscopy analysis from polycrystalline materials. Retrieved from https://par.nsf.gov/biblio/10093991. Review of Scientific Instruments 89.12 Web. doi:10.1063/1.5051451.

Lewis, Ronald M., Jackson, Grayson L., Maher, Michael J., Kim, Kyungtae, Lodge, Timothy P., Mahanthappa, Mahesh K., Narayanan, Suresh, & Bates, Frank S. A new framework for X-ray photon correlation spectroscopy analysis from polycrystalline materials. Review of Scientific Instruments, 89 (12). Retrieved from https://par.nsf.gov/biblio/10093991. https://doi.org/10.1063/1.5051451

Lewis, Ronald M., Jackson, Grayson L., Maher, Michael J., Kim, Kyungtae, Lodge, Timothy P., Mahanthappa, Mahesh K., Narayanan, Suresh, and Bates, Frank S. "A new framework for X-ray photon correlation spectroscopy analysis from polycrystalline materials". Review of Scientific Instruments 89 (12). Country unknown/Code not available. https://doi.org/10.1063/1.5051451. https://par.nsf.gov/biblio/10093991.

@article{osti_10093991,
place = {Country unknown/Code not available}, title = {A new framework for X-ray photon correlation spectroscopy analysis from polycrystalline materials}, url = {https://par.nsf.gov/biblio/10093991}, DOI = {10.1063/1.5051451}, abstractNote = {}, journal = {Review of Scientific Instruments}, volume = {89}, number = {12}, author = {Lewis, Ronald M. and Jackson, Grayson L. and Maher, Michael J. and Kim, Kyungtae and Lodge, Timothy P. and Mahanthappa, Mahesh K. and Narayanan, Suresh and Bates, Frank S.}, }