Lee, Kok-Meng, Hao, Bingjie, Li, Min, and Bai, Kun. Multiparameter Eddy-Current Sensor Design for Conductivity Estimation and Simultaneous Distance and Thickness Measurements. Retrieved from https://par.nsf.gov/biblio/10095032. IEEE Transactions on Industrial Informatics 15.3 Web. doi:10.1109/TII.2018.2843319.

Lee, Kok-Meng, Hao, Bingjie, Li, Min, & Bai, Kun. Multiparameter Eddy-Current Sensor Design for Conductivity Estimation and Simultaneous Distance and Thickness Measurements. IEEE Transactions on Industrial Informatics, 15 (3). Retrieved from https://par.nsf.gov/biblio/10095032. https://doi.org/10.1109/TII.2018.2843319

Lee, Kok-Meng, Hao, Bingjie, Li, Min, and Bai, Kun. "Multiparameter Eddy-Current Sensor Design for Conductivity Estimation and Simultaneous Distance and Thickness Measurements". IEEE Transactions on Industrial Informatics 15 (3). Country unknown/Code not available. https://doi.org/10.1109/TII.2018.2843319. https://par.nsf.gov/biblio/10095032.

@article{osti_10095032,
place = {Country unknown/Code not available}, title = {Multiparameter Eddy-Current Sensor Design for Conductivity Estimation and Simultaneous Distance and Thickness Measurements}, url = {https://par.nsf.gov/biblio/10095032}, DOI = {10.1109/TII.2018.2843319}, abstractNote = {}, journal = {IEEE Transactions on Industrial Informatics}, volume = {15}, number = {3}, author = {Lee, Kok-Meng and Hao, Bingjie and Li, Min and Bai, Kun}, }