Rodriguez-Davila, Rodolfo A., Bolshakov, Pavel, Young, Chadwin D., and Quevedo-Lopez, Manuel. Understanding the Effects of Low-Temperature Passivation and Annealing on ZnO TFTs Test Structures. Retrieved from https://par.nsf.gov/biblio/10098870. 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) . Web. doi:10.1109/ICMTS.2019.8730965.

Rodriguez-Davila, Rodolfo A., Bolshakov, Pavel, Young, Chadwin D., & Quevedo-Lopez, Manuel. Understanding the Effects of Low-Temperature Passivation and Annealing on ZnO TFTs Test Structures. 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), (). Retrieved from https://par.nsf.gov/biblio/10098870. https://doi.org/10.1109/ICMTS.2019.8730965

Rodriguez-Davila, Rodolfo A., Bolshakov, Pavel, Young, Chadwin D., and Quevedo-Lopez, Manuel. "Understanding the Effects of Low-Temperature Passivation and Annealing on ZnO TFTs Test Structures". 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (). Country unknown/Code not available. https://doi.org/10.1109/ICMTS.2019.8730965. https://par.nsf.gov/biblio/10098870.

@article{osti_10098870,
place = {Country unknown/Code not available}, title = {Understanding the Effects of Low-Temperature Passivation and Annealing on ZnO TFTs Test Structures}, url = {https://par.nsf.gov/biblio/10098870}, DOI = {10.1109/ICMTS.2019.8730965}, abstractNote = {}, journal = {2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)}, author = {Rodriguez-Davila, Rodolfo A. and Bolshakov, Pavel and Young, Chadwin D. and Quevedo-Lopez, Manuel}, }