Imani, Farhad, Yao, Bing, Chen, Ruimin, Rao, Prahalad, and Yang, Hui. Joint Multifractal and Lacunarity Analysis of Image Profiles for Manufacturing Quality Control. Retrieved from https://par.nsf.gov/biblio/10109129. Journal of Manufacturing Science and Engineering 141.4 Web. doi:10.1115/1.4042579.

Imani, Farhad, Yao, Bing, Chen, Ruimin, Rao, Prahalad, & Yang, Hui. Joint Multifractal and Lacunarity Analysis of Image Profiles for Manufacturing Quality Control. Journal of Manufacturing Science and Engineering, 141 (4). Retrieved from https://par.nsf.gov/biblio/10109129. https://doi.org/10.1115/1.4042579

Imani, Farhad, Yao, Bing, Chen, Ruimin, Rao, Prahalad, and Yang, Hui. "Joint Multifractal and Lacunarity Analysis of Image Profiles for Manufacturing Quality Control". Journal of Manufacturing Science and Engineering 141 (4). Country unknown/Code not available. https://doi.org/10.1115/1.4042579. https://par.nsf.gov/biblio/10109129.

@article{osti_10109129,
place = {Country unknown/Code not available}, title = {Joint Multifractal and Lacunarity Analysis of Image Profiles for Manufacturing Quality Control}, url = {https://par.nsf.gov/biblio/10109129}, DOI = {10.1115/1.4042579}, abstractNote = {}, journal = {Journal of Manufacturing Science and Engineering}, volume = {141}, number = {4}, author = {Imani, Farhad and Yao, Bing and Chen, Ruimin and Rao, Prahalad and Yang, Hui}, }