Passivation of Thin Channel Zinc Tin Oxide TFTs Using Al 2 O 3 Deposited by O 3 -Based Atomic Layer Deposition
- Award ID(s):
- 1727918
- NSF-PAR ID:
- 10111020
- Date Published:
- Journal Name:
- IEEE Electron Device Letters
- Volume:
- 40
- Issue:
- 7
- ISSN:
- 0741-3106
- Page Range / eLocation ID:
- 1120 to 1123
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation