skip to main content


Title: Structural and electrical characterization of thick GaN layers on Si, GaN, and engineered substrates
Award ID(s):
1711030
PAR ID:
10119179
Author(s) / Creator(s):
; ; ; ; ; ; ;
Date Published:
Journal Name:
Journal of Applied Physics
Volume:
125
Issue:
8
ISSN:
0021-8979
Page Range / eLocation ID:
082517
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
More Like this