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Title: Structural and electrical characterization of thick GaN layers on Si, GaN, and engineered substrates
Authors:
; ; ; ; ; ; ;
Award ID(s):
1711030
Publication Date:
NSF-PAR ID:
10119179
Journal Name:
Journal of Applied Physics
Volume:
125
Issue:
8
Page Range or eLocation-ID:
082517
ISSN:
0021-8979
Sponsoring Org:
National Science Foundation
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