More Like this

1. Pseudorapidity distributions of charged hadrons in xenon-xenon collisions at sNN=5.44 TeV

   https://doi.org/10.1016/j.physletb.2019.135049  

   Sirunyan, A.M. ; Tumasyan, A. ; Adam, W. ; Ambrogi, F. ; Asilar, E. ; Bergauer, T. ; Brandstetter, J. ; Dragicevic, M. ; Erö, J. ; Escalante Del Valle, A. ; et al ( December 2019 , Physics Letters B)
2. A xenon collisional-radiative model applicable to electric propulsion devices: III. Determination of the ionization fraction in low-temperature xenon plasma by using ionic and atomic 6p lines

   https://doi.org/10.1088/1361-6595/acfb37  

   Zhu, Xi-Ming ; Wang, Yan-Fei ; Meng, Sheng-Feng ; Wang, Yang ; Ning, Zhong-Xi ; Yu, Da-Ren ; Bartschat, Klaus ( September 2023 , Plasma Sources Science and Technology)

   The ionization fraction is a key figure of merit for optimizing the performance of plasma device. This work presents an optical emission spectroscopy (OES) method to determine the ionization fraction in low-temperature xenon plasma. The emission line-ratio of xenon ionic and atomic 6p–6stransitions is used in this method. A comprehensive collisional-radiative model developed in our previous work is employed to describe the relationship between the line-ratios and the plasma parameters. It is found that some special line-ratios have a sensitive relationship to the ionization fraction, e.g. the ratio of the 460.30 nm line and 828.01 nm lines. These line-ratios are selected for the diagnostic method. The method is demonstrated in a magnetized discharge chamber. The axially-resolved emission spectra of the ionization chamber are measured, and from those the ionization fraction along the chamber axis is determined via the OES method. The axially-resolved ionization fraction is found to be dependent on the magnetic field and agrees well with those obtained from a Langmuir probe. In the experiment, the probe is overheated under some conditions, possibly due to the bombardment by energetic particles. In this case, no results can be obtained from the probe, while the OES method can still obtain reasonable results. Combined with optical tomography and spectral imaging technology, the OES method can also provide the spatial distribution of the ionization fraction, which is needed for revealing the discharge mechanisms of plasma devices.

    

   more » « less
3. Xenon-1T excess as a possible signal of a sub-GeV hidden sector dark matter

   https://doi.org/10.1007/JHEP02(2021)229  

   Aboubrahim, Amin ; Klasen, Michael ; Nath, Pran ( February 2021 , Journal of High Energy Physics)

   null (Ed.)

   A bstract We present a particle physics model to explain the observed enhancement in the Xenon-1T data at an electron recoil energy of 2.5 keV. The model is based on a U(1) extension of the Standard Model where the dark sector consists of two essentially mass degenerate Dirac fermions in the sub-GeV region with a small mass splitting interacting with a dark photon. The dark photon is unstable and decays before the big bang nucleosynthesis, which leads to the dark matter constituted of two essentially mass degenerate Dirac fermions. The Xenon-1T excess is computed via the inelastic exothermic scattering of the heavier dark fermion from a bound electron in xenon to the lighter dark fermion producing the observed excess events in the recoil electron energy. The model can be tested with further data from Xenon-1T and in future experiments such as SuperCDMS. 

   more » « less
4. Inverse Primakoff Scattering as a Probe of Solar Axions at Liquid Xenon Direct Detection Experiments

   https://doi.org/10.1103/PhysRevLett.125.131805  

   Dent, James B. ; Dutta, Bhaskar ; Newstead, Jayden L. ; Thompson, Adrian ( September 2020 , Physical Review Letters)
5. The nylon balloon for xenon loaded liquid scintillator in KamLAND-Zen 800 neutrinoless double-beta decay search experiment

   https://doi.org/10.1088/1748-0221/16/08/P08023  

   Gando, Y. ; Gando, A. ; Hachiya, T. ; Hayashida, S. ; Hosokawa, K. ; Ikeda, H. ; Mitsui, T. ; Nakada, T. ; Obara, S. ; Ozaki, H. ; et al ( August 2021 , Journal of Instrumentation)