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Title: Detecting Recycled SoCs by Exploiting Aging Induced Biases in Memory Cells
Award ID(s):
1755733
NSF-PAR ID:
10137068
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
Page Range / eLocation ID:
72 to 80
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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