Shao, Yu-Tsun, Chen, Zhen, Mei, Antonio, Holtz, Megan, Padgett, Elliot, Schlom, Darrell, and Muller, David A. Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM. Retrieved from https://par.nsf.gov/biblio/10146300. Microscopy and Microanalysis 25.S2 Web. doi:10.1017/S1431927619010420.

Shao, Yu-Tsun, Chen, Zhen, Mei, Antonio, Holtz, Megan, Padgett, Elliot, Schlom, Darrell, & Muller, David A. Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM. Microscopy and Microanalysis, 25 (S2). Retrieved from https://par.nsf.gov/biblio/10146300. https://doi.org/10.1017/S1431927619010420

Shao, Yu-Tsun, Chen, Zhen, Mei, Antonio, Holtz, Megan, Padgett, Elliot, Schlom, Darrell, and Muller, David A. "Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM". Microscopy and Microanalysis 25 (S2). Country unknown/Code not available. https://doi.org/10.1017/S1431927619010420. https://par.nsf.gov/biblio/10146300.

@article{osti_10146300,
place = {Country unknown/Code not available}, title = {Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM}, url = {https://par.nsf.gov/biblio/10146300}, DOI = {10.1017/S1431927619010420}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {25}, number = {S2}, author = {Shao, Yu-Tsun and Chen, Zhen and Mei, Antonio and Holtz, Megan and Padgett, Elliot and Schlom, Darrell and Muller, David A.}, }