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Title: Dependent-test-aware regression testing techniques
Award ID(s):
1763788 1839010 1816615
NSF-PAR ID:
10175679
Author(s) / Creator(s):
; ; ; ; ;
Date Published:
Journal Name:
ACM International Symposium on Software Testing and Analysis (ISSTA 2020)
Page Range / eLocation ID:
298 to 311
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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