Iterative Test Generation for Gate-Exhaustive Faults to Cover the Sites of Undetectable Target Faults
- Award ID(s):
- 1714147
- PAR ID:
- 10176502
- Date Published:
- Journal Name:
- International Test Conference
- Page Range / eLocation ID:
- 1 to 7
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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