Dutta, Sanghamitra, Jeong, Haewon, Yang, Yaoqing, Cadambe, Viveck, Low, Tze Meng, and Grover, Pulkit. Addressing Unreliability in Emerging Devices and Non-von Neumann Architectures Using Coded Computing. Retrieved from https://par.nsf.gov/biblio/10177434. Proceedings of the IEEE 108.8 Web. doi:10.1109/JPROC.2020.2986362.

Dutta, Sanghamitra, Jeong, Haewon, Yang, Yaoqing, Cadambe, Viveck, Low, Tze Meng, & Grover, Pulkit. Addressing Unreliability in Emerging Devices and Non-von Neumann Architectures Using Coded Computing. Proceedings of the IEEE, 108 (8). Retrieved from https://par.nsf.gov/biblio/10177434. https://doi.org/10.1109/JPROC.2020.2986362

Dutta, Sanghamitra, Jeong, Haewon, Yang, Yaoqing, Cadambe, Viveck, Low, Tze Meng, and Grover, Pulkit. "Addressing Unreliability in Emerging Devices and Non-von Neumann Architectures Using Coded Computing". Proceedings of the IEEE 108 (8). Country unknown/Code not available. https://doi.org/10.1109/JPROC.2020.2986362. https://par.nsf.gov/biblio/10177434.

@article{osti_10177434,
place = {Country unknown/Code not available}, title = {Addressing Unreliability in Emerging Devices and Non-von Neumann Architectures Using Coded Computing}, url = {https://par.nsf.gov/biblio/10177434}, DOI = {10.1109/JPROC.2020.2986362}, abstractNote = {}, journal = {Proceedings of the IEEE}, volume = {108}, number = {8}, author = {Dutta, Sanghamitra and Jeong, Haewon and Yang, Yaoqing and Cadambe, Viveck and Low, Tze Meng and Grover, Pulkit}, }