Knipfer, B., Rajeev, A., Isheim, D., Kirch, J.D., Babcock, S.E., Kuech, T.F., Earles, T., Botez, D., and Mawst, L.J. Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography. Retrieved from https://par.nsf.gov/biblio/10183611. Journal of Crystal Growth 535.C Web. doi:10.1016/j.jcrysgro.2020.125550.

Knipfer, B., Rajeev, A., Isheim, D., Kirch, J.D., Babcock, S.E., Kuech, T.F., Earles, T., Botez, D., & Mawst, L.J. Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography. Journal of Crystal Growth, 535 (C). Retrieved from https://par.nsf.gov/biblio/10183611. https://doi.org/10.1016/j.jcrysgro.2020.125550

Knipfer, B., Rajeev, A., Isheim, D., Kirch, J.D., Babcock, S.E., Kuech, T.F., Earles, T., Botez, D., and Mawst, L.J. "Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography". Journal of Crystal Growth 535 (C). Country unknown/Code not available. https://doi.org/10.1016/j.jcrysgro.2020.125550. https://par.nsf.gov/biblio/10183611.

@article{osti_10183611,
place = {Country unknown/Code not available}, title = {Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography}, url = {https://par.nsf.gov/biblio/10183611}, DOI = {10.1016/j.jcrysgro.2020.125550}, abstractNote = {}, journal = {Journal of Crystal Growth}, volume = {535}, number = {C}, author = {Knipfer, B. and Rajeev, A. and Isheim, D. and Kirch, J.D. and Babcock, S.E. and Kuech, T.F. and Earles, T. and Botez, D. and Mawst, L.J.}, }