Knipfer, B., Rajeev, A., Isheim, D., Kirch, J.D., Babcock, S.E., Kuech, T.F., Earles, T., Botez, D., and Mawst, L.J. Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography. Retrieved from https://par.nsf.gov/biblio/10183611. Journal of Crystal Growth 535.C Web. doi:10.1016/j.jcrysgro.2020.125550.
Knipfer, B., Rajeev, A., Isheim, D., Kirch, J.D., Babcock, S.E., Kuech, T.F., Earles, T., Botez, D., & Mawst, L.J. Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography. Journal of Crystal Growth, 535 (C). Retrieved from https://par.nsf.gov/biblio/10183611. https://doi.org/10.1016/j.jcrysgro.2020.125550
Knipfer, B., Rajeev, A., Isheim, D., Kirch, J.D., Babcock, S.E., Kuech, T.F., Earles, T., Botez, D., and Mawst, L.J.
"Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography". Journal of Crystal Growth 535 (C). Country unknown/Code not available. https://doi.org/10.1016/j.jcrysgro.2020.125550.https://par.nsf.gov/biblio/10183611.
@article{osti_10183611,
place = {Country unknown/Code not available},
title = {Layer-thickness dependence of the compositions in strained III–V superlattices by atom probe tomography},
url = {https://par.nsf.gov/biblio/10183611},
DOI = {10.1016/j.jcrysgro.2020.125550},
abstractNote = {},
journal = {Journal of Crystal Growth},
volume = {535},
number = {C},
author = {Knipfer, B. and Rajeev, A. and Isheim, D. and Kirch, J.D. and Babcock, S.E. and Kuech, T.F. and Earles, T. and Botez, D. and Mawst, L.J.},
}
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